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A transmission electron microscope shows the large-angle, convergent-beam electron diffraction pattern of an area of silicon crystal 100 x 100 nanometers. Experiment by S. Frabboni and A. Spessot; artwork by Lucia Covi; image courtesy of S3-INFM, Modena.
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Search FindLaw's database of Supreme Court decisions since 1893 (U.S. Reports, volumes 150-present). Browsable by U.S. Reports volume number and by year. Searchable by citation, case title, and full text.
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